![]() |
||
The Scanning Electron Microscope LabDescription: The SEM is an instrument that uses an electron beam to produce highly magnified, three-dimensional images of a sample along with qualitative elemental analysis via x-ray energy collection. Imaging: Various types of samples (e.g. whole rock pieces, polished thin sections powders, etc.) can be observed and analyzed by use of the SEM. Images can be produced that vary in magnification from 10X to 20,000X with crisp, clear resolution. The three basic types of images are Secondary Electron, Backscatter Electron and X-ray dot maps. Images can be collected, processed and stored digitally.
X-ray Analysis: Attached to the SEM is a PGT Spirit analyzing system. This is an Energy Dispersive Spectrometer that collects, processes and graphs x-rays from the sample. Simultaneous elemental analysis is accomplished by measurement of x-ray energy. Individual minerals can be identified at any particular spot by use of the EDS.
Proposed upgrade: In the coming year the department hopes to improve the capabilities of the SEM lab by adding the following upgraded equipment and techniques:
John Skok
|