The Rocky Mountain Environmental X-ray Photoelectron Spectroscopy (E-XPS) center is a user facility for state-of-the-art surface analysis measurements.
XPS measures material surface compositions by measuring the intensity of photoelectrons emitted as a function of the incident X-ray energy. By correlating the X-ray energy to the photoelectron binding energy, the features of an XPS spectra are used to identify the surface species present and calculate the molar percentage of the surface occupied by each.
The Rocky Mountain E-XPS extends these traditional capabilities by enabling measurements in a range of environmental conditions. The instrument, based on the HiPP lab system from Scienta Omicron, can measure XPS at various pressures and temperatures, and with variable chemical compositions. Unlike traditional UHV XPS systems, the Rocky Mountain E-XPS can therefore look at surface states for functional materials in relevant environments and with optional electronic biasing for analysis of non-equilibrated surface states.