Instruments To download a printable PDF of all SIF instruments click here: SIF Instrumentation AllElectron MicroscopyMass SpectrometryMaterials CharacterizationMechanical TestingNanofabricationScanning Probe & Optical MicroscopyThin Film DepositionWater Quality AnalysisX-ray Diffraction & CTX-ray Photoelectron Spectroscopy4-Probe Probe / Electrical Probe Station ABM UV Mask Aligner AJA Sputtering System AJA UHV Multi-Technique Deposition System Angstrom Thermal Evaporator ASYLUM MFP-3D SCANNING PROBE MICROSCOPE AutoGlow 200 Reactive Ion Etcher CAMECA LEAP 4000X SI Cleanroom and Lab Access Course Cleanrooms Complimentary Equipment and Fixtures Digital Instruments AFM DR-6000 Hach DSI GLEEBLE 3500-GTC Electromechanical Load Frames Fatigue Machines FEI Helios Nanolab 600I FIB/SEM FEI Quanta 600I Environmental SEM FEI TALOS F200X TEM/STEM FEI TECNAI T12 FTIR Spectrometer/Ellipsometer Furnaces Hall System High Temperature Thermal Evaporator IONTOF TOF-SIMS.V Janis Cryostat JEOL JSM-7000F FIELD EMISSION SEM Karl Suss Mask Aligner Keyence VHX-5000 MTS EXCEED E22 IMPACT TESTER Panalytical Empyrean X-ray Diffractometer PANALYTICAL X’PERT PRO X-RAY DIFFRACTOMETER Phenom SEM Profilometer Raith Voyager E-beam Lithography System Rocky Mountain Environmental XPS User Facility Sciex 5500 Triple Quad Sciex x500R QToF SEM – What is the Right Instrument? Semicore Sputtering System Servohydraulic Load Frames Shimadzu TOC-L Total Carbon Analyzer Solar Simulator Tabletop Gold Sputter Coater TESCAN S8252G RAMAN-SEM/FIB Thermo Scientific Orbitrap Exploris 120 ThermoScienific Dionex ICS-900 UV-Vis Spectrometer Wire Bonder WITEC LASER CONFOCAL RAMAN MICROSCOPE Woollam M-2000 Ellipsometer Zeiss Versa 520 XCT
