Digital Instruments AFM

DIGITAL INSTRUMENTS AFM

FEI TALOS F200X TEM/STEM

Location

Hill Hall 310 & CoorsTek 040

Contact

Alex Dixon – agdixon@mines.edu

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Instrument Details

The Digital Instruments Atomic Force Microscope is a high-resolution scanning probe microscope with sub-nanometer vertical resolution and sub-micron horizontal resolution. The system uses a sharp tip on the edge of a cantilever to scan a samples surface and record fluctuations. It can be used to characterize surface roughness, grain boundaries, lithographic structures, and polymeric materials.