DIGITAL INSTRUMENTS AFM
Alex Dixon – firstname.lastname@example.org
The Digital Instruments Atomic Force Microscope is a high-resolution scanning probe microscope with sub-nanometer vertical resolution and sub-micron horizontal resolution. The system uses a sharp tip on the edge of a cantilever to scan a samples surface and record fluctuations. It can be used to characterize surface roughness, grain boundaries, lithographic structures, and polymeric materials.