MATERIALS-CHARACTERIZATION-LAB-1-e1627492885991 Digital Instruments AFM

CoorsTek 040


Alex Dixon –

Instrument Details

The Digital Instruments Atomic Force Microscope is a high-resolution scanning probe microscope with sub-nanometer vertical resolution and sub-micron horizontal resolution. The system uses a sharp tip on the edge of a cantilever to scan a samples surface and record fluctuations. It can be used to characterize surface roughness, grain boundaries, lithographic structures, and polymeric materials.

microscope1 Digital Instruments AFM

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