FEI TALOS F200X TEM/STEM

FEI TALOS F200X TEM/STEM

FEI TALOS F200X TEM/STEM

Location

CoorsTek 001-P

Contact

Praveen Kumar – kumar@mines.edu

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Instrument Details

The FEI Co. Talos F200X 200keV field emission scanning / transmission electron microscope is located in the CoorsTek Building (Room 001P). The FEI X-FEG high brightness electron source delivers high total current — up to five times the beam current of a standard Schottky FEG — while the integrated EDS system with four silicon drift detectors (SDDs) offers mapping capabilities of up to 105 spectra/sec. It has a TEM information limit better than 0.12 nm. The STEM probe allows for an imaging resolution of 0.16 nm. STEM images can be viewed in bright field or with multiple dark field detectors, including a high-angle annular dark field detector (HAADF) allowing for Z-contrast imaging.

  • Schottky Field Emission Gun
  • Up to 200kV Accelerating Voltage
  • Conventional and Scanning Modes (TEM/STEM)
  • High Resolution (HREM): 0.12 nm Information Limit
  • Super-X EDS for Spectral Imaging
  • High Angle Annular (HAADF) and Centered (CDF) Dark Field Modes
Specimen Prep Capabilities in the Electron Microscopy Lab

GENERAL

  • Slow Speed Diamond Saws
  • EVACTRON CombiClean Decontaminator

SEM

  • JEOL IB-0910CP Cross-Section Polisher
  • Hummer IV Sputtering System (Au/C Coater)

TEM

  • 3mm Foil Punch
  • South Bay Model 350 3mm TEM Disk Cutter
  • Gatan Model 600 Duo Mill Ar ion mill
  • Fischione Electropolishing System