JEOL JSM-7000F FIELD EMISSION SEM

JEOL JSF-7000F FIELD EMISSION SEM

jeol jsm 7000f in use

Location

Hill Hall 176-E

Contact

Gary Zito – gzito@mines.edu 

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Instrument Details

The JSM-7000F is a field-emission scanning electron microscope with a Schottky type field-emission gun for the electron source and state-of-the-art computer technology for the image-display system. The instrument is equipped for energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD) analysis.

  • Schottky Field Emission Cathode
  • High Resolution (1.2nm @30kV)
  • Secondary (SEI) and Backscatter (BEI-TOPO/COMPO) Imaging
  • EDAX “Octane Pro” SDD EDS
  • EDAX “Hikari Pro” 600pps EBSD detector
  • Electron Lithography
Specimen Prep Capabilities in the Electron Microscopy Lab

GENERAL

  • Slow Speed Diamond Saws
  • EVACTRON CombiClean Decontaminator

SEM

  • JEOL IB-0910CP Cross-Section Polisher
  • Hummer IV Sputtering System (Au/C Coater)

TEM

  • 3mm Foil Punch
  • South Bay Model 350 3mm TEM Disk Cutter
  • Gatan Model 600 Duo Mill Ar ion mill
  • Fischione Electropolishing System