malvern-panalytical-empyrean Panalytical Empyrean X-ray Diffractometer


CoorsTek 001-C


Xerxes Steirer –

Instrument Details

The Panalytical Empyrean X-ray diffractometer provides crystallographic and compositional information critical to understanding part mechanical performance. It features small- and wide-angle X-ray scattering (SAXS/WAXS) and has the ability to test samples at temperatures ranging from −200 °C to 1100 °C. It can also capture information on texture, residual stress and pair distribution functions.

  • Cu and Mo radiation for low- and high-energy X-ray diffraction (XRD)
  • Reflection/transmission geometry with rotating sample for improved statistics
  • Spinning capillary
  • Bragg–Brentano optics and focusing geometry
  • Residual strain measurements
  • Cu/Mo focusing mirror and monocapillary 100 µm beam for microdiffraction
  • 5-axis Eulerian cradle for texture mapping
  • Grazing incidence XRD
  • Pair distribution function
  • Galipix 3D area detector
  • In situ stages from −190 up to 1100 °C (−328 to 2012 °F) with 3-axis cradle
  • Cr, Cu and Mo X-ray tubes available for variety of measurements
  • Cr base high resolution residual stress including parallel beam optic and microbeam dual mask set
microscope1 Panalytical Empyrean X-ray Diffractometer

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Money-copy Panalytical Empyrean X-ray Diffractometer

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