WOOLLAM M-2000 ELLIPSOMETER
Instrument Details
- Simultaneous measurement at 485 wavelengths between 210 nm and 1000 nm
- Rotating compensator optical path
- Data acquisition for a complete spectrum in as little as 1 sec
- Horizontal sample stage with vacuum chuck sample hold
- Variable incident angle between 45 and 90 degrees
- Automated sample height adjustment
- Beam diameter 2-5 mm
- Focusing optics can be installed to reduce illuminated spot to 0.3 x 0.9 mm
- CompleteEASE software for data acquisition and analysis