Zeiss Versa 520 XCT

The Zeiss Xradia Versa 3D X-ray microscope enables cutting-edge, nondestructive tomographic imaging and grain reconstruction. X-ray tomography (μ-XCT) allows for the collection of both surface and internal renderings, which are used to distinguish between phases and identify defects such as porosity. Nondestructive diffraction contrast tomography (DCT) provides direct 3D crystallographic grain reconstructions for crystalline materials. Our lab offers the unique ability to first nondestructively characterize pore distributions in sample parts using the Zeiss Xradia Versa, then to mechanically test those same parts using the load frames described below to correlate defect structures and mechanical behavior.

• Absorption contrast tomography: resolution to 0.7 µm; up to 160 kV to probe metallic samples up to 4 mm in diameter; automated center shift and reconstruction; automated ring artifact elimination
• Phase contrast tomography: improved resolution at phase boundaries to distinguish particle dispersions
• Dual-energy tomography: low- and high-energy scans allow for segmentation based on differential X-ray absorption
• Diffraction contrast tomography: grain mapping provides crystallographic orientation of samples; grain size approximation enables the preparation of samples for synchrotron experiments
• In situ load frame for testing samples under tensile or compression up to 5 kN