AFM1-500x375-1 Asylum MFP-3D Scanning Probe Microscope


Alderson Hall 463


Praveen Kumar –


Instrument Details

The Asylum MFP-3D atomic force microscope is coupled to an optical microscope (Olympus) for simultaneous imaging and physical properties measurements at the nanoscale for a wide range of advanced materials in renewable energy and life sciences. We can measure electrical and mechanical properties of materials in direct registry with topography at nanoscale resolution under their designed operating conditions (e.g illumination of photovoltaics and hydrated conditions for biological). The measurement of interfacial physical properties at small length scales is essential to the development of the next generation of materials for renewable energy and life sciences. Specific advanced capabilities beyond standard SPM modes (contact, tapping, phase) include:

  • Optical Microscopy: The AFM head is integrated with an inverted optical microscope, facilitating the quick identification of the specific region of interest and enables optical stimulation to obtain properties such as a photoconductivity or fluorescence in registry with topology.
  • Electro/Mechanical Measurements: The instrument enables spatially resolved measurements of critical material properties such as conductivity, piezoelectricity, Kelvin Probe, modulus, and viscoelasticity.
  • Environmental Control: Samples may be evaluated under controlled conditions: temperature (–35°C to 300°C), humidity, fluid cells, and illumination intensity/wavelength.
  • We gratefully acknowledge the National Science Foundation and Colorado School of Mines for funding this facility through award #CBET-1532179.
microscope1 Asylum MFP-3D Scanning Probe Microscope

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