Hallsystem Hall System


CoorsTek 040


Alex Dixon – agdixon@mines.edu

Instrument Details

The HL5500PC is a high-performance Hall Effect Measurement System. It enables measurement of resistivity, carrier concentration and mobility on a wide range of semiconductors and with minimum effort in sample preparation. The HL5500PC is designed as a modular system and the basic instrument can measure sheet resistivity’s up to a few MOhm/square and Hall voltages of a few µV. Samples can have Van der Pauw, bar or bridge shaped geometries, and dual temperature measurements (at room temperature and 77 K) are readily achievable.

  • Thickness should be less than 1/15 of the peripheral length (less than 1mm), and uniform to ±1%.
  • Sheet resistivity’s of 0.1 mΩ/square to in excess of 1 MΩ/square
  • Optional to extend sheet resistivity measurements to 1011Ω/square
  • Max Measurement Diameter: 25 mm
  • Magnet: Permanent with field reversal by magnet rotation
  • Support for van der Pauw, Hall bar and bridge samples
  • Integration, delay & repeat measurement modes increase flexibility and accuracy on difficult to measure samples
  • Easy to export data and information
microscope1 Hall System

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