M2000-ellipsometer-image-scaled Woollam M-2000 Ellipsometer


CoorsTek 040


Alex Dixon – agdixon@mines.edu

Instrument Details

  • Simultaneous measurement at 485 wavelengths between 210 nm and 1000 nm
  • Rotating compensator optical path
  • Data acquisition for a complete spectrum in as little as 1 sec
  • Horizontal sample stage with vacuum chuck sample hold
  • Variable incident angle between 45 and 90 degrees
  • Automated sample height adjustment
  • Beam diameter 2-5 mm
  • Focusing optics can be installed to reduce illuminated spot to 0.3 x 0.9 mm
  • CompleteEASE software for data acquisition and analysis
microscope1 Woollam M-2000 Ellipsometer

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Money-copy Woollam M-2000 Ellipsometer

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