Rocky Mountain Environmental XPS User Facility
EXP_Capabilities_Banner Rocky Mountain Environmental XPS User Facility


CoorsTek 001-K


Xerxes Steirer –

Instrument Details

The Rocky Mountain Environmental X-ray Photoelectron Spectroscopy (E-XPS) center is a user facility for state-of-the-art surface analysis measurements.

XPS measures material surface compositions by measuring the intensity of photoelectrons emitted as a function of the incident X-ray energy. Spectra features are used to identify the surface species present and calculate the fraction of the surface occupied by each.

The Rocky Mountain E-XPS extends these traditional capabilities by enabling measurements in a range of environmental conditions.

The instrument, based on the HiPP lab system from Scienta Omicron, can measure XPS at various pressures and temperatures, and with variable chemical compositions.

Unlike traditional UHV XPS systems, the Rocky Mountain E-XPS can therefore look at surface states for functional materials in relevant environments and with optional electronic biasing for analysis of non-equilibrated surface states.



The HiPP Lab from Scienta Omicron utilizes a high power, high energy resolution monocrhomated Al-Kα source with 600 W continuous operation and modified for near-ambient pressure XPS measurements.’


The energy analyzer boasts the following specifications:

  • Energy resolution < 15 meV FWHM at 20 eV pass energy and 500 eV kinetic energy
  • Pass energies of 20, 50, 100, 200, and 500 eV.

The analyzer can operate in standard transmission mode, or collect one-shot measurements to analyze spectra as a function of X-ray energy and either angle (angular mode) or lateral position (spatial mode).

  • Transmission mode kinetic energy range: 20 eV – 1500 eV
  • Angular mode kinetic energy range: 100 eV – 1500 eV. Parallel angular range: ± 9 degrees.
  • Spatial mode kinetic energy range: 20 eV – 1500 eV. Spatial resolution: < 10 μm

Sample Environment Conditions

  • Gas pressures of up to 30 mbar
  • Temperatures of up to 700 C.
  • Gas flow management system allows mixing of two separate feed gases, controlled via mass flow controllers, plus optional water vapor.
  • Chamber exhaust composition quantified and monitored via quadrupole mass spectrometer.
  • Optional electrical leads for operando biasing of samples.


  • Custom Python-based software package for analysis of in situ time resolved XPS analysis
  • CASA XPS for standard XPS data processing
microscope1 Rocky Mountain Environmental XPS User Facility

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