Tescan Tescan S8252G Raman-SEM/FIB


CoorsTek 001-M


Alejandro Barrios –  alejandro.barrios@mines.edu

tescan s8252g raman sem/fib POLICIES AND PROCEDURES

Billing schedule:

Charges are invoiced at the end of each calendar month.  Internal charges are directly uploaded to Banner.

Supervisors should review charges in FOM each month to limit the need for manual adjustments after charges have been uploaded.  Users may contact the facility director to discuss any disputed charges.

Rates are published on the website and calculated in consultation with the Controller’s office.

There is a minimum charge of 15 minutes of use.

Instrument Access:

FOM automatically disables scheduling access to this instrument for a user who has not used the instrument in over one year.  A user who wishes to regain access should schedule a refresher training session with the instrument manager.


Reservations are made in half-hour time increments.

In order to promote additional usage while still providing less frequent users adequate access, daytime weekday reservations (8 AM – 5 PM) are limited in total hours per user per instrument at any given time.  For the S8252G this is set at 8 hours.

There is no limit on the number of hours reserved overnight and on weekends.

The schedule is open for reservation 14 days in advance.  If special circumstances require reserving a time further in advance, contact the instrument manager.

A user can immediately access an unreserved instrument during the day (via express logon) regardless of other reservation limitations.

Daytime, Evening and Weekends:

In order to promote additional usage while still providing less frequent users adequate access, weekday daytime reservations (8 AM – 5 PM) are limited in total hours per user per instrument at any given time.  For most instruments this is set at 8 hours.

There is no limit on the number of hours reserved overnight and on weekends.

There are currently no billing distinctions between day and evening use, however, in order to encourage the development of proficient users and not limit productive research, usage over 12 hours/month by one user on one project is charged at 30% of the hourly rate for this instrument.

Flexible start/end time:

Start/end time is calculated to the second so that you are billed for the actual instrument time you have used.

Unused reservation:

If user does not show up within 30 minutes after reserved start time, the reservation will be cancelled and another user may use the time period. The user who made the reservation will be charged a half hour no-show/late cancellation fee.

Cancelled reservation:

Late cancellations or no shows will be charged 50% of the reserved time. (If 2 hours were reserved, 1 hour of usage will be charged.)

Late cancellation is considered as cancellation fewer than 16 hours before the scheduled start time.

We will follow up individually with frequent offenders, with the possibility of temporarily suspending their scheduling access.

If there are extenuating circumstances, such as a medical emergency, the late cancellation fee will be waived.

If an instrument is down, users will not be charged for unused reservations and do not need to cancel their reservations.

Forgetting to login/logout:

Users should notify the instrument manager or leave a note in the FOM comments if they forgot to log in to FOM at the start of their session or forgot to log off FOM at the end of their session.

Report of equipment problem:

If an instrument is not functioning properly during the session, the user should notify the instrument manager as soon as possible.  This can be done in person or in the comments in FOM. For reports in FOM, instrument managers will receive an email notice and address the problem as soon as possible. Instrument managers will also determine whether the usage charge should be reduced or waived due to the problem reported.

Specimen Prep Capabilities in the Electron Microscopy Lab


  • Slow Speed Diamond Saws
  • EVACTRON CombiClean Decontaminator


  • JEOL IB-0910CP Cross-Section Polisher
  • Hummer IV Sputtering System (Au Coater)
  • Cressington Carbon Coater


  • 3mm Foil Punch
  • South Bay Model 350 3mm TEM Disk Cutter
  • Gatan Model 600 Duo Mill Ar ion mill
  • Fischione Electropolishing System

Instrument Details

The TESCAN S8000G is an ultra-high resolution variable pressure Schottky field emission scanning electron microscope/Ga+ focused ion beam instrument for imaging and sample milling and W, Pt, and Co deposition (GIS) capabilities. It is equipped with WITec in situ confocal Raman imaging at 532 nm and 785 nm excitation wavelengths using a 100x objective, NA = 0.75.  The SEM/FIB has an Everhart-Thornley detector, two retractable backscatter detectors (one water-cooled), an in-beam multi-detector, in-beam axial detector, and secondary ion detector.  The instrument is also capable of 3-D imaging using any of the detectors.

Nanoscale compositional analysis may be performed with an EDAX Octane Elect Plus (30mm2) energy dispersive X-ray spectroscopy (EDS) system with APEX software.

The EDAX Velocity™ Pro EBSD camera offers high-speed electron backscatter diffraction (EBSD) mapping (up to 2500 pps) using a CMOS sensor and can be used in combination with the EDS detector for simultaneous EDS-EBSD data collection.

In situ manipulation for TEM foil extraction is performed using a SmarAct nano-manipulator, with 1 nm positioning resolution and an electron flood gun for charge neutralization during ion beam milling of non-conductive samples.

The Gatan Murano heating stage allows for in situ analysis from room temperature to 950° C.

  • SEM Resolution: 0.9 nm at 15 kV (at 1 mm WD)
  • Ga Source Focused Ion Beam (FIB) – 0.5 kV to 30 kV, up to 100nA
  • Optical resolution: diffraction limited lateral typ. 430 nm @ 532 nm excitation wavelength
  • 532 nm, 75 mW diode-pumped solid state laser
  • 785 nm, 125 mW diode laser
  • Fully motorized, heavy-duty compucentric 5-axis cradle stage (X=256mm, Y=152mm, Z=52mm, Rotation=360°, Bidirectional tilt = –3° to 60°, 8kg weight capacity

This instrument was acquired through the support of the National Science Foundation (DMR-1828454).  The EBSD detector was funded through an ONR-DURIP grant.

microscope1 Tescan S8252G Raman-SEM/FIB

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